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Thus far some different SPM have been developed. The most important at Univerity of Basle can be summarized in three groups. They are named according to their probe or method by which they scan the surface:
- Scanning Tunneling Microscope (STM): Measuring by electrical current. As result we get a map mixed out of electrical and topographical conditions.
- Atomic Force Microscope (AFM): Measuring by atomic forces. The result depends on the magnetic and topographical conditions of the material.
- Scanning Near-Field Optical Microscope (SNOM): Measuring by a light source or optical detector. The SNOM renders informations about the intensity, the wave-length (colour) and the condtition of polarization of the light.
SPM are used in fundamental research as well as in the industry. There is an extensive research in friction measuring at the University of Basle. The goal is to predict friction by knowing the molecular structure of a surface. Moreover the research of the materials properties has been intensified by the new microscopes.
In the Industry SPM are often used to detect defects in the structure of materials.
Through the possibility to impact certain atoms some new not yet all known ways are opening to the research.
One field is the advancement of the microchip. The aim is to develop a chip with the dimensions of some nanometers. It will last some years because this research is very recent. It is no more based on clectrical conditions but on atomic ones.
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