Introduction
History
Principle
History of microscopes
From waterdrops to ...
Microscopy techniques
Medizine
Lightmicroscopy
Electronmicroscopy I
Electronmicroscopy II
Scanningtunnelingmicroscopy
Oddities
The Microscopes
STM
Construction
Measuring Principle
Tunneling current
Tip
Two methods
AFM
Construction
Measuring principle
Atomic forces
Contact Mode
Tapping Mode
Pieces
Piezos
Controller
Limits
Internal
External
Glossary
 

Two methods

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Copyright by Gary Larson: The Far Side

The height of the cantilever is kept constant:

Thus only the deflection is recorded and together with the spring constant the force is calculated.

Problem: The deflection of the cantilever is a little non-linear. The spring constant gets more incorrect the greater the deflection and thus the calculation of the force.

The vertical position is adjusted:

The feedback controller ensures that the force which is on the tip is kept constant. Thus the sample is adjusted in its vertical position. By this means the non-linearity of the cantilever is avoided.

 
  Tip                This is the end of the trail

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