Introduction
History
Principle
History of microscopes
From waterdrops to ...
Microscopy techniques
Medizine
Lightmicroscopy
Electronmicroscopy I
Electronmicroscopy II
Scanningtunnelingmicroscopy
Oddities
The Microscopes
STM
Construction
Measuring Principle
Tunneling current
Tip
Two methods
AFM
Construction
Measuring principle
Atomic forces
Contact Mode
Tapping Mode
Pieces
Piezos
Controller
Limits
Internal
External
Glossary
 

Contact Mode

deutsch
 

While drawn over the surface the tip is kept in contact with the sample. Between the top atom of the tip and the sample atomic forces compel the the tip to adjust following a variation of the surface. Therefore the deflection of the cantilever has to change. Because the spring constant is known the forces can be calculated by the formula F=k*d. Afterwards the data is recorded by the computer.

Torsion: The tip can shortly get stuck in the pits which forces the cantilever to a torsion. This disturbs a proper measurement of the topography. In contrast we can measure atomic friction by the torsions. See the tutorial frictionmodule for further information on atomic friction.

 
  Atomic forces                  Tapping Mode

Please send comments to .