Introduction
History
Principle
History of microscopes
From waterdrops to ...
Microscopy techniques
Medizine
Lightmicroscopy
Electronmicroscopy I
Electronmicroscopy II
Scanningtunnelingmicroscopy
Oddities
The Microscopes
STM
Construction
Measuring Principle
Tunneling current
Tip
Two methods
AFM
Construction
Measuring principle
Atomic forces
Contact Mode
Tapping Mode
Pieces
Piezos
Controller
Limits
Internal
External
Glossary
 

AFM

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Copyright by Gary Larson: The Far Side

While a tip is drawn over a surface atomic forces affect the behaviour of the the former (vibration or deflection). These variations are recorded. Out of the resulting data we can perform a map of the atomic topography. In difference to the STM the electrical conductivity is not needed.

 

Subsections:

Construction
Measuring principle
Atomic forces
Contact Mode
Tapping Mode
  STM                  Pieces

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