Introduction
History
Principle
History of microscopes
From waterdrops to ...
Microscopy techniques
Medizine
Lightmicroscopy
Electronmicroscopy I
Electronmicroscopy II
Scanningtunnelingmicroscopy
Oddities
The Microscopes
STM
Construction
Measuring Principle
Tunneling current
Tip
Two methods
AFM
Construction
Measuring principle
Atomic forces
Contact Mode
Tapping Mode
Pieces
Piezos
Controller
Limits
Internal
External
Glossary
 

STM

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Copyright by Gary Larson: The Far Side

Between the tip and the material we impress a voltage. For this reason the material has to be conductive. While the tip is directed over the surface the microscope is measuring the changes in tension which is mainly caused by changes of the topography. Finally we have a map of electrostatic conditions influenced by the topography.

 

Subsections:

Construction
Measuring Principle
Tunneling current
Tip
Two methods
  The Microscopes                  AFM

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